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Method to estimate a corrected response of a measurement apparatus relative to a set of known responses and observed measurements
Method to estimate a corrected response of a measurement apparatus relative to a set of known responses and observed measurements
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机译:相对于一组已知响应和观察到的测量来估计测量设备的校正响应的方法
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摘要
The present invention provides a new method to determine corrected characteristics of materials using the measured quantities obtained by a measurement and an extensive set of database points representing laboratory and modeled results in well defined environments. In particular the invention relates to the measurement of the characteristics of the formation around a wellbore as well as of the borehole with a well logging tool. Using a dynamic parametrization technique, the environmental corrections and the transformations from the measured to the physical characteristics can be achieved in a more accurate, robust and flexible way. The dynamic local parametrization is based on a weighted multiple linear regression over the entire database to obtain the local coefficients for the transformation which can be expressed as a simple equation.
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