A method to estimate the point response function of digital x-ray detectors from edge measurements

摘要

Currently, the most accurate measurement of the detector point response can be performed with the pinhole method. The small size of the pinhole however, severely reduces the x-ray intensity output, requiring multiple long exposures, something that can potentially reduce the x-ray tube life-cycle. Even though deriving the ID Line Response Function (LRF) of the detector using the edge method is much more efficient, the measurement process introduces a convolution with a line, in addition to the common pixel sampling, effectively broadening the LRF. We propose a practical method to recover the detector point response function by removing the effects of the line and the pixel from a set of Edge Response Function (ERF) measurements. We use the imaging equation to study the effects of the edge, line and pixel measurements, and derive an analytical formula for the recovered detector point response function based on a gaussian mixture model. The method allows for limited recovery of asymmetries in the detector response function. We verify the method with pinhole and edge measurements of a digital flat panel detector. Monte Carlo simulations are also performed, using the MANTIS x-ray and optical photon and electron transport simulation package, for comparison. We show that the standard LRF underestimates the detector performance when compared with the recovered response. Our simulation results suggest that both the edge and pinhole methods for estimating the detector response have limitations in that they cannot completely capture rotational asymmetries or other morphological details smaller than the detector pixel size.