Experimental measurement of slit response function and corrected infrared thermographic measurements.

摘要

Infrared thermography utilizes emitted radiation to measure temperatures optically. An experimental facility and procedures were defined to measure emissivity and temperature of unresolved (target angle ;An Inframetrics 600L infrared camera and the associated data acquisition system were characterized to maximize thermal measurement sensitivity. The minimum specimen size that can be resolved thermally with the infrared camera was determined. The effect of specimen size on thermal signature was quantified for the infrared detector utilizing the slit response function (SRF). A standard procedure to measure emissivity was validated and a SRF measurement correction was verified. These two pieces of information increased the measurement capabilities of the infrared system and minimized experimental error when working with thermal targets smaller than the thermal measurement resolution of the system.