Tripod for polishing a sample and for viewing the sample under a microscope

摘要

A sample holder tripod for grinding a square edge on a sample and for observing the sample with a microscope is provided. The sample tripod comprises: a tripod base, a support, two adjustable micrometer leg assemblies, a sample stage and a grinding bubble indicator. The micrometer leg assembles are mounted to the tripod through a micrometer mounting holes. The stage has a means to mount a sample. The sample holder tripod can be positioned to view the sample in a top down view and cross-sectional view without having to re-focus the microscope.