METHOD AND APPARATUS FOR ANALYZING CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT, COMPUTER READABLE STORAGE MEDIUM STORING CIRCUIT ANALYSIS PROGRAM, AND SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To make it possible to test a threshold voltage of an SOI(silicon on insulator)-MOSFET with a floating body node. ;SOLUTION: A circuit equation solving unit 4A outputs data relating to a threshold voltage of an SOI-MOSFET with a floating body node. The data from the circuit equation solving unit 4A is stored in a memory unit 6. The threshold voltage of the SOI-MOSFET with a floating body node is tested by a floating check unit 7 using the data stored in the memory unit 6.;COPYRIGHT: (C)1999,JPO