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method and device for electrically conductive film with a study of systems have and their application for the production of optical glass fibres

机译:系统研究的导电膜的制造方法和装置及其在光学玻璃纤维生产中的应用

摘要

A method and system for accurately inspecting an electroconductive film using an eddy current and a process and apparatus for production of an optical fiber which measures on-line the electrical resistance, which shows the state of formation of the electroconductive hermetic coating of the optical fiber by the electroconductive film inspection method and reflects back the measurement results to the hermetic coating forming conditions are disclosed. Optical fiber is made up of a core, cladding, amorphous carbon film or other electroconductive hermetic coating formed on the outer surface of the cladding, and a protective coating. The electrical resistance of the hermetic coating generates an eddy current at the coating, the eddy current generated is detected, and the phase angle of the complex impedance is detected to enable calculation. In particular, to accurately detect the phase angle, the high frequency current for generating the eddy current is changes by a low frequency of about 1/100th of the high frequency to change the average intensity and obtain at least two points of measurement defining the above phase angle. The electrical resistance of the hermetic coating is calculated from this phase angle. The electrical resistance shows the state of formation of the hermetic coating. The measurement value of the electrical resistance of the hermetic coating is used for setting the hermetic coating production conditions. The electroconductive film inspection method of the present invention may also be used for quality control etc. of thin films. IMAGE
机译:一种利用涡流精确检查导电膜的方法和系统,以及一种在线测量电阻的光纤生产工艺和装置,该方法显示了通过以下方法形成光纤的导电密封涂层的状态公开了一种导电膜检查方法,并且将测量结果反映到气密涂层形成条件。光纤由形成在包层外表面上的芯,包层,无定形碳膜或其他导电密封涂层和保护层组成。密封涂层的电阻在涂层处产生涡流,检测产生的涡流,并检测复阻抗的相角以进行计算。特别地,为了精确地检测相角,用于产生涡流的高频电流改变为高频的大约1/100的低频,以改变平均强度并获得至少两个测量点来定义上述内容。相位角。从该相角计算出气密涂层的电阻。电阻表示气密涂层的形成状态。气密涂层的电阻的测量值用于设置气密涂层的生产条件。本发明的导电膜检查方法还可以用于薄膜的质量控制等。 <图像>

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