An inspection substrate capable of inspecting an integrated circuit device operating in a merged data output mode and a standard operation mode together

摘要

The present invention relates to an inspection board capable of inspecting an integrated circuit device operating in a standard operation mode and an element operating in a merged data output (MDQ) mode on a single substrate. The inspection substrate includes a mode selection signal And a predetermined number of merged data output terminals from which data is output, among the data output terminals of the device when the device operates in the MDQ mode, are sequentially connected to the I / O terminals of the substrate. When the device is in the standard operation mode, And a scan signal terminal for selectively enabling a plurality of elements are provided in the inspection board. This substrate for inspection can be inspected for a large number of elements at the same time by using the MDQ method, and it is possible to know which data output terminal of the partially defective element has caused an abnormality, so that it can be applied to utilization of the partially defective element, And it is possible to reduce the cost required for manufacturing the inspection board.