The inspection substrate which can inspect the integrated circuit component which operates as a closing data output mode and a canonical operational mode together

摘要

During burn-in testing of IC devices, the devices operate in either merged data output mode for shortening the test time or in standard mode for detecting defective data output terminals of the devices. A single test board is provided to test the devices regardless of the operational mode. The test board wiring patterns electrically connect a predetermined number of merged data output terminals of the device to the I/O pins of the test board when the devices are in the merged data output mode. When the devices operate in the standard mode, the wiring patterns electrically connect all the output terminals of the devices to the I/O pins.