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Corrosion and dendrite growth prevention method between both ends of fuse gap and integrated circuit

机译:防止熔丝间隙两端与集成电路之间腐蚀和枝晶生长的方法

摘要

Voltage limiting circuitry for fuse technology is disclosed. An integrated circuit includes a fuse having two terminals and a voltage limiting circuit connected to the terminal. The voltage limiting circuit minimizes the voltage across the fuse gap generated by the fuse rupture in response to the fuse rupture through a low impedance sensing circuit. Thus, the present invention prevents dendrite growth and corrosion in copper or similar types of fuses.
机译:公开了用于保险丝技术的电压限制电路。集成电路包括具有两个端子的保险丝和连接到该端子的限压电路。响应于通过低阻抗感测电路的保险丝破裂,限压电路使由保险丝破裂产生的保险丝间隙两端的电压最小。因此,本发明防止了铜或类似类型的保险丝中的枝晶生长和腐蚀。

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