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Corrosion and dendrite growth prevention method between both ends of fuse gap and integrated circuit
Corrosion and dendrite growth prevention method between both ends of fuse gap and integrated circuit
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机译:防止熔丝间隙两端与集成电路之间腐蚀和枝晶生长的方法
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摘要
Voltage limiting circuitry for fuse technology is disclosed. An integrated circuit includes a fuse having two terminals and a voltage limiting circuit connected to the terminal. The voltage limiting circuit minimizes the voltage across the fuse gap generated by the fuse rupture in response to the fuse rupture through a low impedance sensing circuit. Thus, the present invention prevents dendrite growth and corrosion in copper or similar types of fuses.
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