Probe card for wafer test and wafer tester with same

摘要

The present invention discloses a probe card for a wafer test and a wafer tester having the same, by adjusting the vertical rising height of the wafer to prevent the tip from being damaged by the lower pressure. The probe card for a wafer test is a printed circuit board, a needle-shaped tip attached to a predetermined surface of the lower portion of the printed circuit board through a fixture, and outputting a test signal, and one end thereof is located at the bottom of the printed circuit board. And a tip guard attached to another predetermined surface of the substrate to support the printed circuit board and prevent the tip from being damaged due to the rise of the wafer in contact with the tip.