Tracking method of faulty integrated circuits on surface mounted devices using flying probe test arrangement

摘要

The method uses a vector less test method. Current voltage characteristic curves from input or output circuits of the electronic components (7) and their current consumption are measured as a function of the supply voltage and are analysed. The supply voltage is provided by two galvanic contacts and the current consumption is obtained indirectly via a magnetic field sensor (5). The magnetic field sensor (5) measures the local magnetic fields caused by the current. Input and output circuits of an electronic component (7) may be galvanically contacted via a corresponding circuit node. The respective second contact may be connected to an earth terminal or a supply voltage terminal of the component (7).