Apparatus and method for soft error comparison testing

摘要

A method and apparatus for soft error comparison testing of electronic components exposed to a flux of high energy particles, while providing for simultaneous comparison testing of different components at full rated operating speed, and providing for programmable control of level of the supply voltage applied to the components. Included a method and apparatus for simultaneously exposing electronic components to a flux of high energy particles, operating the components, and simultaneously measuring soft errors of the components induced by the flux of high energy particles.