首页> 外国专利> Semiconductor processing method of providing electrical isolation between adjacent semiconductor diffusion regions of different field effect transistors and integrated circuitry having adjacent electrically isolated field effect transistors

Semiconductor processing method of providing electrical isolation between adjacent semiconductor diffusion regions of different field effect transistors and integrated circuitry having adjacent electrically isolated field effect transistors

机译:在不同场效应晶体管的相邻半导体扩散区域之间提供电隔离的半导体处理方法以及具有相邻电隔离场效应晶体管的集成电路

摘要

Integrated circuitry having adjacent electrically isolated field effect transistors is disclosed and which includes a bulk semiconductor substrate; an electrically insulative device isolation mass located on the substrate and positioned between opposing active area regions; a first pair of LDD diffusion regions associated with the active area and abutting against the electrically insulative device isolation mass; a pair of field effect transistors each being received within one active area; a second paid of LDD diffusion regions associated with the active area and abutting against each field effect transistor; and a pair of electrically conductive transistor source and drain diffusion regions which are respectively spaced from the insulative isolation mass and field effect transistor.
机译:公开了具有相邻的电隔离场效应晶体管的集成电路,该集成电路包括体半导体衬底;和位于衬底上并位于相对的有源区域之间的电绝缘器件隔离块;第一对LDD扩散区域,其与有源区域相关联并且邻接电绝缘器件隔离块;一对场效应晶体管,每个场效应晶体管被接收在一个有源区内;第二付费的LDD扩散区,其与有源区相关并邻接每个场效应晶体管;一对导电晶体管的源极和漏极扩散区,分别与绝缘隔离质量和场效应晶体管隔开。

著录项

  • 公开/公告号US5925916A

    专利类型

  • 公开/公告日1999-07-20

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US19980100522

  • 发明设计人 CHARLES H. DENNISON;TRUNG TRI DOAN;

    申请日1998-06-18

  • 分类号H01L29/76;H01L29/94;H01L31/062;H01L3/113;

  • 国家 US

  • 入库时间 2022-08-22 02:07:47

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