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Isolated SOI memory structure with vertically formed transistor and storage capacitor in a substrate

机译:在衬底中具有垂直形成的晶体管和存储电容器的隔离式SOI存储器结构

摘要

A semiconductor device and method for manufacturing the same includes a plurality of memory cells, each cell having a transistor formed on a first semiconductor substrate and comprising first and second impurity regions and a gate electrode, and a compacitor comprising a first electrode connected with the first impurity region of the transistor and a second electrode formed on the first electrode with a dielectric film disposed therebetween, wherein a channel region formed between the first impurity region and the second impurity region of the transistor is vertically located on the capacitor, and a contact hole connecting the second impurity region of the transistor with the bit- line is vertically located on the channel region, thus achieving the cell area required for one-giga-bit memory devices and beyond and enabling increased capacitance.
机译:半导体器件及其制造方法包括:多个存储单元,每个存储单元具有形成在第一半导体衬底上的晶体管,该晶体管包括第一和第二杂质区以及栅电极;以及电容器,该电容器包括与第一电极连接的第一电极。晶体管的杂质区域和形成在第一电极上的第二电极,第二电极之间夹有介电膜,其中形成在晶体管的第一杂质区域和第二杂质区域之间的沟道区域垂直位于电容器上,并且接触孔将晶体管的第二杂质区与位线连接的垂直位于沟道区上,从而实现了一个千兆位存储器件所需的单元面积,并且超出了该范围,并且能够增加电容。

著录项

  • 公开/公告号US5959322A

    专利类型

  • 公开/公告日1999-09-28

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US19940299018

  • 发明设计人 KYU-PIL LEE;

    申请日1994-08-31

  • 分类号H01C21/20;

  • 国家 US

  • 入库时间 2022-08-22 02:07:08

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