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Non-contact surface roughness evaluation method and non-contact surface roughness evaluation device

机译:非接触表面粗糙度评估方法和非接触表面粗糙度评估装置

摘要

Abstract Topic It is strong in the physical properties of the sample which evaluates the roughness of the surface dependenceIt makes evaluation method of the dielectric which satisfies fixed condition without doing,Evaluation of the surface roughness which was te general purpose, had certainty non connectionThe surface roughness evaluation method which can do quickly with touching is offeredru. Solutions In the sample 2 which is the dielectric from the laser illuminant 1In angle of incidence 0 to irradiate the laser, dispersion buriyusuta angle B1To receive the scattered wave in with polarization bimusupuritsuta 3, S partialTo acquire the wave component with 1st photodetector 4, the P polarized wave component 2nd lightYou acquire with detector, 5 acquire from 1st and 2nd photodetector 4,5Are done ratio of the S polarized wave component and the P polarized wave component which computer 6Compared with the specified criteria data roughness of the evaluation aspect of sample 2You evaluate.
机译:<摘要> <主题>评估表面依赖性粗糙度的样品的物理性能强使不满足固定条件的电介质的评估方法成为通用,对表面粗糙度的评估具有确定性提供了可以快速进行触摸的表面粗糙度评估方法。解决方案样品2是激光光源1的电介质,入射角 0 照射激光,色散buriyusuta角 B1 以偏振bimusupuritsuta接收散射波3,S部分要用第一光电探测器4获取波分量,第二偏振光P偏振分量用探测器获取,从第一和第二光电探测器5获取4,5S偏振波分量与P偏振波分量的比值由计算机完成6与指定的标准相比,样品2的评估方面的数据粗糙度要评估。

著录项

  • 公开/公告号JP3010213B1

    专利类型

  • 公开/公告日2000-02-21

    原文格式PDF

  • 申请/专利权人 郵政省通信総合研究所長;

    申请/专利号JP19980267451

  • 发明设计人 川西 哲也;

    申请日1998-09-04

  • 分类号G01B11/30;G01B15/00;G01B21/30;G01N21/88;

  • 国家 JP

  • 入库时间 2022-08-22 02:04:39

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