首页> 外国专利> The x-ray polarization analyzer and uses that the x-ray polarization analysis manner

The x-ray polarization analyzer and uses that the x-ray polarization analysis manner

机译:X射线偏振分析仪及其使用的X射线偏振分析方式

摘要

PROBLEM TO BE SOLVED: To provide an X-ray polarization analyzer and its X-ray polarization analyzing method capable of measuring different linear polarization components at a common polarization element rotating position. ;SOLUTION: A X-ray polarization element a3 is used which is, for a σ polarization X-ray component 2 contributing to diffraction, thick sufficiently and least in transmission intensity and, for a π polarization X-ray component 5 not contributing to diffraction, thin sufficiently and less in attenuation due to damping and can be transmitted sufficiently. Also, a detector a6 and a detector b7 of the same performance are located at a position to which each polarization component enters. In addition, in order to make the σ polarization X-ray component 2 in parallel with the direction of injection X-ray 1 relative to the X-ray polarization element a3, sufficiently thick one more crystal is used as the X-ray polarization element b4 to make the σ polarization X-ray component 2 in parallel with the X-ray bundle of the π polarization X-ray component 5.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:提供一种能够在相同的偏振元件旋转位置处测量不同的线性偏振分量的X射线偏振分析仪及其X射线偏振分析方法。 ;解决方案:使用X射线偏振元件a3,对于有助于衍射的σ偏振X射线分量2,其厚度足够厚且透射强度最低,对于不有助于衍射的π偏振X射线分量5则使用。足够薄,并且由于阻尼而导致的衰减较小,并且可以充分传输。而且,具有相同性能的检测器a6和检测器b7位于每个偏振分量进入的位置。另外,为了使σ偏振X射线分量2相对于X射线偏振元件a3平行于注入X射线1的方向,使用足够厚的一个以上的晶体作为X射线偏振元件。 b4使σ极化X射线分量2与π极化X射线分量5的X射线束平行;版权:(C)1999,JPO

著录项

  • 公开/公告号JP3013827B2

    专利类型

  • 公开/公告日2000-02-28

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP19970343259

  • 发明设计人 泉 弘一;

    申请日1997-12-12

  • 分类号G01N23/20;

  • 国家 JP

  • 入库时间 2022-08-22 02:03:55

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号