首页> 外国专利> X-RAY POLARIZATION ANALYZER AND ITS X-RAY POLARIZATION ANALYZING METHOD

X-RAY POLARIZATION ANALYZER AND ITS X-RAY POLARIZATION ANALYZING METHOD

机译:X射线极化分析仪及其X射线极化分析方法

摘要

PROBLEM TO BE SOLVED: To provide an X-ray polarization analyzer and its X-ray polarization analyzing method capable of measuring different linear polarization components at a common polarization element rotating position. SOLUTION: A X-ray polarization element a3 is used which is, for a polarization X-ray component 2 contributing to diffraction, thick sufficiently and least in transmission intensity and, for a polarization X-ray component 5 not contributing to diffraction, thin sufficiently and less in attenuation due to damping and can be transmitted sufficiently. Also, a detector a6 and a detector b7 of the same performance are located at a position to which each polarization component enters. In addition, in order to make the polarization X-ray component 2 in parallel with the direction of injection X-ray 1 relative to the X-ray polarization element a3, sufficiently thick one more crystal is used as the X-ray polarization element b4 to make the polarization X-ray component 2 in parallel with the X-ray bundle of the polarization X-ray component 5.
机译:解决的问题:提供一种能够在相同的偏振元件旋转位置处测量不同的线性偏振分量的X射线偏振分析仪及其X射线偏振分析方法。解决方案:使用X射线偏振元件a3,对于有助于衍射的偏振X射线分量2足够厚且透射强度最小,对于不有助于衍射的偏振X射线分量5足够薄。并且由于阻尼而导致的衰减较小,并且可以充分传输。而且,具有相同性能的检测器a6和检测器b7位于每个偏振分量进入的位置。另外,为了使偏振X射线成分2相对于X射线偏振元件a3平行于射出X射线1的方向,使用足够厚的一个以上的晶体作为X射线偏振元件b4。使偏振X射线分量2与偏振X射线分量5的X射线束平行。

著录项

  • 公开/公告号JPH11174002A

    专利类型

  • 公开/公告日1999-07-02

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP19970343259

  • 发明设计人 IZUMI KOICHI;

    申请日1997-12-12

  • 分类号G01N23/20;

  • 国家 JP

  • 入库时间 2022-08-22 02:35:43

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号