首页> 外国专利> QUANTITATIVE MEASURING METHOD FOR DLC FILM BY USING RAMAN SPECTROSCOPY

QUANTITATIVE MEASURING METHOD FOR DLC FILM BY USING RAMAN SPECTROSCOPY

机译:拉曼光谱法定量测定DLC薄膜

摘要

PROBLEM TO BE SOLVED: To obtain a quantitative measuring method which does not require labor and time so much and which prevents the occurrence of a case in which a DLC film cannot be quantita tively determined or in which the quantitatively determined result of the DLC film is not reliable. ;SOLUTION: The approximate value of a base is decided by a straight line on the basis of two points A, B in positions which sandwich two peaks of a measuring spectrum. After that, the base of the measuring spectrum is corrected in such a way that the inclination the straight line as the approximate value becomes horizontal. Then, by using the spectrum whose base is corrected, respective approximate values which are used as initial parameters for the peaks are found. The approximate values of positions for the peaks are found by, e.g. an MEM method or the like other than a waveform separation calculation. The approximate value of the height of the peaks and that of the width between the peaks are found on the basis of the measuring spectrum or by the waveform separation calculation based on the measuring spectrum whose base is corrected. The found approximate value of the peaks and that of the base are used as initial values for respective parameters, and the respective parameters of the peaks and the base of the measuring spectrum are found by the waveform separation calculation. As a result, a diamondlike carbon(DLC) film is quantitatively calculated on the basis of the respective found parameters.;COPYRIGHT: (C)2000,JPO
机译:要解决的问题:获得一种定量测量方法,该方法不需要那么多的劳动和时间,并且可以防止发生无法定量确定DLC膜或定量确定DLC膜的结果的情况。不可靠的。 ;解决方案:基准的近似值由一条直线确定,该直线基于将测量光谱的两个峰夹在中间的两个点A,B。此后,以使作为近似值的直线的倾斜成为水平的方式校正测量光谱的基数。然后,通过使用校正了其底的光谱,找到用作峰值的初始参数的各个近似值。峰值位置的近似值可通过例如除了波形分离计算之外,还可以使用MEM方法等。峰的高度的近似值和峰之间的宽度的近似值是基于测量频谱或通过基于校正了基线的测量频谱的波形分离计算而求出的。所求出的峰的近似值和基峰的近似值被用作各个参数的初始值,并且通过波形分离计算来求出峰的各个参数和测量光谱的基数。结果,根据各自发现的参数对类金刚石碳(DLC)膜进行了定量计算。COPYRIGHT:(C)2000,JPO

著录项

  • 公开/公告号JP2000214091A

    专利类型

  • 公开/公告日2000-08-04

    原文格式PDF

  • 申请/专利权人 JEOL LTD;

    申请/专利号JP19990013089

  • 发明设计人 KATO HIROSHI;

    申请日1999-01-21

  • 分类号G01N21/65;G01J3/44;

  • 国家 JP

  • 入库时间 2022-08-22 01:59:36

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号