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RAMAN SPECTROSCOPY METHOD FOR SIMULTANEOUSLY MEASURING TEMPERATURE AND THERMAL STRESS OF TWO-DIMENSIONAL FILM MATERIAL IN SITU
RAMAN SPECTROSCOPY METHOD FOR SIMULTANEOUSLY MEASURING TEMPERATURE AND THERMAL STRESS OF TWO-DIMENSIONAL FILM MATERIAL IN SITU
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机译:拉曼光谱法同时测量二维膜材料的温度和热应力原位
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摘要
Provided is a Raman spectroscopy method for simultaneously measuring a temperature and a thermal stress of a two-dimensional film material in situ. The method includes: providing the two-dimensional film material including a suspended part and a supported part and measuring Raman signals of the suspended part and the supported part; establishing equations of a Raman shift with temperature and a Raman shift with thermal stress for each of the suspended part and the supported part, and solving simultaneous equations to obtain coefficients with temperature and thermal stress; and scanning a characteristic Raman spectrum field of the two-dimensional film material and obtaining a temperature distribution and a thermal stress distribution of the two-dimensional film material according to the characteristic Raman spectrum field in combination of the coefficients of the Raman shift with temperature and the Raman shift with thermal stress.
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