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The dielectric separable substrate production manner null of the semiconductor device and the dielectric separable substrate which use
The dielectric separable substrate production manner null of the semiconductor device and the dielectric separable substrate which use
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机译:使用的半导体器件和电介质可分离基板的电介质可分离基板的生产方式无效
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摘要
PURPOSE:To decrease the number of trenches occupying comparatively large areas, and to increase an element forming area by forming element isolating trench sections insularly isolating a second silicon wafer and a silicon layer and element isolating insulating films shaped onto the side faces of the trench sections or buried and formed in the trench sections. CONSTITUTION:A second silicon wafer (a wafer for shaping an element) 102 as a p- active layer is bonded onto a wafer 101 through an oxide film (an insulating film) 103. The bonding is realized in such a manner that each surface of two silicon wafers 101, 102 is mirror-polished, the oxide film is formed to at least one of ground surfaces, and these surfaces are superposed. An n- epitaxial layer 104 is grown on the p- active layer 102', and a V trench 105 is shaped to these each layer 102', 104. An oxide film 106 is formed onto the side face of the V trench 105, and the V trench 105 is buried with a polycrystalline silicon film 107. A MOS element and a bipolar element, etc., are formed to the n- epitaxial layer 104.
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