Device for monitoring the thickness of a dielectric coating on a dielectric substrate. (Ustroystvo dlya kontrolya tolshchiny dielektricheskogo pokrytiya na dielektricheskoy osnove).

摘要

This invention is comprised of a device for monitoring the thickness of a dielectric coating on a dielectric substrate, comprising a capacitive sensor in the form of a dielectric substrate on which are mounted a high-potential and low-potential electrode, made in the form of coplanar, concentric rings. An additional electrode is located in such fashion that the initial capacitances between the high-potential electrode and the additional electrodes and between the additional electrode and the low-potential electrode are equal. Additional components are a switch whose middle contact is connected with the additional electrode, and the edge contacts are connected with high-potential and low-potential electrodes, a high-frequency generator, a bridge circuit connected to said generator, and a recorder. The invention may be used to monitor the thickness of a dielectric coating applied to a dielectric substrate, for example paint and polymer coatings on leather and textiles. The goal of the invention is to increase measurement accuracy.