The semiconductor integrated circuit and its design manner and records the design program of the semiconductor integrated circuit the record media

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for which a clock signal- generating circuit, etc., provided in the integrated circuit can be tested easily. ;SOLUTION: A select signal output circuit 10 is provided in a semiconductor integrated circuit. When '0' is inputted to the D-terminal of the circuit 10, the circuit 10 switches a selector 12 to a partial circuit 2 side and a scan FF(flip flop) 11 inputs the output of the partial circuit 2. At the time of conducting scan tests, a select signal of '0' or '1' value is inputted to the select signal output circuit 10 from a scan-in terminal 3 and further inputted to the selector 12. The selector 12 selects the partial circuit 2 side when the select signal is '0' or the clock signal of a clock signal generating circuit 9 when the select signal is '1'. The output of the partial circuit 2 or the clock signal of the clock signal generating circuit 9 inputted to the scan FF 11 is outputted to the outside from a scan-out terminal 8 through a scan path 20.;COPYRIGHT: (C)1999,JPO