首页> 外国专利> NONVOLATILE MEMORY HAVING CONTACTLESS ARRAY STRUCTURE WHICH CAN RESERVE SUFFICIENT ON CURRENT WITHOUT INCREASING RESISTANCE EVEN IF WIDTH OF BIT LINE IS REDUCED AND CREATION OF HYPERFINE STRUCTURE IS TRIED AND METHOD OF MANUFACTURING NONVOLATILE MEMORY

NONVOLATILE MEMORY HAVING CONTACTLESS ARRAY STRUCTURE WHICH CAN RESERVE SUFFICIENT ON CURRENT WITHOUT INCREASING RESISTANCE EVEN IF WIDTH OF BIT LINE IS REDUCED AND CREATION OF HYPERFINE STRUCTURE IS TRIED AND METHOD OF MANUFACTURING NONVOLATILE MEMORY

机译:非易失性存储器具有连续的阵列结构,即使减小了位线的宽度并创建了超精细结构,并且仍采用了制造非易失性的方法,它可以在电流上保留足够的电流而不会增加电阻

摘要

Non-volatile memory includes a semiconductor region 1 and the impurity diffusion layer 5 of the second conductivity type of the first conductivity type. The second conductive type of the impurity diffusion layer (5) is in a predetermined region of the semiconductor region 1 and the first conductivity type is formed by doping the impurity of the other second conductivity type. The impurity diffusion layer 5 is used as a bit line. The impurity diffusion layer (5) and has a specific layer than the impurity concentration is substantially 1 × 10 18-3, A is the diffusion length, B is the thickness of a specific layer in the depth direction in the transverse direction from the predetermined area B
机译:非易失性存储器包括半导体区域1和第一导电类型的第二导电类型的杂质扩散层5。杂质扩散层(5)的第二导电类型在半导体区域1的预定区域中,并且通过掺杂另一第二导电类型的杂质来形成第一导电类型。杂质扩散层5用作位线。杂质扩散层(5)具有比杂质浓度大1×10 18 -3的特定层, A是扩散长度,B是厚度从预定区域B沿横向在深度方向上的特定层的厚度

著录项

  • 公开/公告号KR19990083105A

    专利类型

  • 公开/公告日1999-11-25

    原文格式PDF

  • 申请/专利权人 가네꼬 히사시;

    申请/专利号KR19990012617

  • 申请日1999-04-09

  • 分类号H01L21/8247;

  • 国家 KR

  • 入库时间 2022-08-22 01:46:34

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