首页> 外国专利> Nonvolatile memory having contactless array structure which can reserve sufficient on current, without increasing resistance, even if width of bit line is reduced and creation of hyperfine structure is tried, and method of manufacturing nonvolatile memory

Nonvolatile memory having contactless array structure which can reserve sufficient on current, without increasing resistance, even if width of bit line is reduced and creation of hyperfine structure is tried, and method of manufacturing nonvolatile memory

机译:具有即使在减小位线的宽度并尝试形成超精细结构的情况下也能够在不增加电阻的情况下保持足够的电流的非接触阵列结构的非易失性存储器以及制造非易失性存储器的方法

摘要

A nonvolatile memory includes a first conductive type of semiconductor region and a second conductive type of impurity diffusion layer. The impurity diffusion layer is formed by doping into a predetermined region of the semiconductor region, impurity of the second conductive type that differs from the first conductive type. The impurity diffusion layer is used as a bit line. The impurity diffusion layer has a specific layer in which an impurity density is substantially equal to or higher than 1×1018 cm−3, and wherein BA where A is a diffusion length in a lateral direction from the predetermined region and B is a thickness of the specific layer in a depth direction.
机译:非易失性存储器包括第一导电类型的半导体区域和第二导电类型的杂质扩散层。通过将不同于第一导电类型的第二导电类型的杂质掺杂到半导体区域的预定区域中来形成杂质扩散层。杂质扩散层用作位线。杂质扩散层具有特定层,在该特定层中,杂质密度基本上等于或高于1×10 18 cm ≤3,并且其中B> A,其中A B是从预定区域在横向上的扩散长度,B是特定层在深度方向上的厚度。

著录项

  • 公开/公告号US6172393B1

    专利类型

  • 公开/公告日2001-01-09

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US19990287517

  • 发明设计人 KOHJI KANAMORI;YOSHIAKI HISAMUNE;

    申请日1999-04-07

  • 分类号H01L297/88;

  • 国家 US

  • 入库时间 2022-08-22 01:05:44

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