A method for measuring light in a wide wavelength range simultaneously with light in a plurality of wavelength ranges, and a method for measuring an incident slit

摘要

The present invention relates to a method for effectively measuring the intensity of light of various wavelengths within a wide range of wavelength without effecting a structural change of the spectroscope and an incidence slit for a spectroscope implementing this method.;In the present invention, at least two light input use slits (21) of the spectroscope (20) are arranged in the diagonal direction above and below and arranged in the width (W) range of the CCD detector (30) As a detector (CCD detector), there are a method of measuring spectra of different wavelength regions by the number of slits, and a method of measuring the number of slits 21, which constitute at least two slits 21a in the upper and lower diagonal directions, And the like.