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DOUBLE FILM SILICON DEVICE WITHOUT FLOATING BODY EFFECT

机译:无浮膜效应的双膜硅器件

摘要

PURPOSE: The device is made to remove the floating body effect by controlling the potential in the channel region by forming a metal electrode on the back surface of a double film silicon wafer and applying a constant voltage to the metal electrode. CONSTITUTION: The device comprises: a silicon substrate(9); a buried insulation film(8) formed on the silicon substrate; a top silicon layer(6) located on top of the buried insulation film; a field oxide(4) which is formed on a region of the top silicon layer and whose bottom part is contacted with the buried insulation film; and a metal layer(11) formed on the back surface of the silicon substrate.
机译:目的:通过在双层硅晶片的背面上形成金属电极并向金属电极施加恒定电压,控制沟道区域中的电位,从而消除浮体效应。组成:该设备包括:硅基板(9);在硅衬底上形成掩埋绝缘膜(8);位于掩埋绝缘膜顶部的顶部硅层(6);场氧化物(4),其形成在顶部硅层的区域上并且其底部与掩埋绝缘膜接触;在硅基板的背面形成金属层(11)。

著录项

  • 公开/公告号KR20000003494A

    专利类型

  • 公开/公告日2000-01-15

    原文格式PDF

  • 申请/专利权人 HYUNDAI ELECTRONICS IND. CO. LTD.;

    申请/专利号KR19980024736

  • 发明设计人 LEE JONG WOOK;

    申请日1998-06-29

  • 分类号H01L27/14;H01L29/02;

  • 国家 KR

  • 入库时间 2022-08-22 01:46:19

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