首页> 外国专利> LATERAL SOI BIPOLAR MOS FIELD EFFECT TRANSISTOR HAVING TRENCH GATE AND METHOD OF FABRICATING THE SAME

LATERAL SOI BIPOLAR MOS FIELD EFFECT TRANSISTOR HAVING TRENCH GATE AND METHOD OF FABRICATING THE SAME

机译:具有沟槽门的横向SOI双极MOS场效应晶体管及其制造方法

摘要

PURPOSE: A horizontal-type SOI bipolar mode FET having a trench gate and a method for making the same are provided to achieve an enhanced electric characteristic, reduce a change of an element characteristic as well as an influence of a buried oxide layer. CONSTITUTION: A first conductive source area(40) is separated from a first conductive drain area(41), and they have a predetermined depth. A second conductive gate area is near to one area between the source and drain areas(40,41), insulates a gate plug deeper than the areas, and is contacted with a lower part of the trench. If the first conductive area is made of N-type impurity ion, the second conductive area is made of P-type ion. The gate plug is nearer to the source area, and is made of a polysilicon.
机译:目的:提供具有沟槽栅极的水平型SOI双极型FET及其制造方法,以实现增强的电特性,减少元件特性的变化以及掩埋氧化物层的影响。构成:第一导电源极区域(40)与第一导电漏极区域(41)分离,并且它们具有预定深度。第二导电栅区靠近源区和漏区之间的一个区(40,41),使栅塞比这些区深,并使之与沟槽的下部接触。如果第一导电区域由N型杂质离子制成,则第二导电区域由P型离子制成。栅极插头更靠近源极区域,并且由多晶硅制成。

著录项

  • 公开/公告号KR100268065B1

    专利类型

  • 公开/公告日2000-10-16

    原文格式PDF

  • 申请/专利权人 HAN MIN GOO;

    申请/专利号KR19980007489

  • 申请日1998-03-06

  • 分类号H01L27/06;

  • 国家 KR

  • 入库时间 2022-08-22 01:44:38

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