首页> 外国专利> Semiconductor device with a multiple vertical p-n junction layer, e.g. a vertical MOSFET, IGBT, bipolar transistor or diode, is produced by ion implantation and heat treatment to form vertical drift zones or separation zones

Semiconductor device with a multiple vertical p-n junction layer, e.g. a vertical MOSFET, IGBT, bipolar transistor or diode, is produced by ion implantation and heat treatment to form vertical drift zones or separation zones

机译:具有多个垂直p-n结层的半导体器件,例如通过离子注入和热处理产生垂直MOSFET,IGBT,双极晶体管或二极管,以形成垂直漂移区或分离区

摘要

Production of a semiconductor device with a multiple vertical p-n junction layer (22) involves ion implantation and heat treatment to form vertical drift zones (22a) or separation zones (22b). Production of a semiconductor device, with a multiple p-n junction layer (22) which comprises a horizontal alternating arrangement of first conductivity type drift zones (22a) and second opposite conductivity type separation zones (22b) extending parallel to one another in the vertical direction and which forms a current path when the device is ON and is depleted when the device is OFF, comprises implanting dopant ions and heat treating to form the drift zones (22a) or the separation zones (22b). An independent claim is also included for a semiconductor device produced by the above process.
机译:具有多个垂直p-n结层(22)的半导体器件的生产涉及离子注入和热处理,以形成垂直漂移区(22a)或分离区(22b)。具有多个pn结层(22)的半导体器件的制造,该多层pn结层包括在垂直方向上彼此平行延伸的第一导电类型漂移区(22a)和第二相对导电类型分离区(22b)的水平交替布置,并且当器件开启时形成电流路径,而当器件关闭时耗尽电流,该步骤包括注入掺杂剂离子并进行热处理以形成漂移区(22a)或分离区(22b)。通过上述方法制造的半导体器件也包括独立权利要求。

著录项

  • 公开/公告号DE10000754A1

    专利类型

  • 公开/公告日2000-07-13

    原文格式PDF

  • 申请/专利权人 FUJI ELECTRIC CO. LTD.;

    申请/专利号DE2000100754

  • 发明设计人 MIYASAKA YASUSHI;FUJIHIRA TATSUHIKO;

    申请日2000-01-11

  • 分类号H01L29/861;H01L29/78;H01L21/336;H01L21/329;

  • 国家 DE

  • 入库时间 2022-08-22 01:41:56

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