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Formation manner of polycrystal silicone films and production manner null of thin film

机译:多晶硅膜的形成方式及薄膜的生产方式

摘要

PURPOSE: To manufacture a TRFT almost free of crystalline grain boundary in the current path in a channel region with excellent reproducibility by controlling the position of crystalline grain boundary on an insulating substrate as well as arranging the orientation degree of individual crystalline grains to form polycrystalline silicon film in large grain diameter. CONSTITUTION: The first polycrystalline silicon film 4 arranged with orientation degree in the vertical direction to the stepped part side 7 is obtained by forming the first amorphous silicon 3 film on an insulating substrate 1 formed of a stepped part 2 to be heat-treated. Next, the whole surface is patterned leaving the region containing the part above the stepped part 2. Next, the second amorphous silicon film 8 is formed on the pattern and the first polycrystalline silicon film 4 is used as a seed to solid crystallize so that the orientation degree and the position of crystalline grain boundary controlling the second polycrystalline silicon film 9 may be formed. Finally, when a channel region 12i formed making the vertical direction to the side of the stepped part 2, a current path may be coincide with the epitaxial growing direction.
机译:用途:通过控制绝缘基板上的晶粒边界位置以及安排单个晶粒的取向度以形成多晶硅,从而以极好的可重复性制造沟道区域中电流路径中几乎没有晶粒边界的TRFT粒径大的薄膜。构成:第一多晶硅膜4在与台阶部分侧7垂直的方向上取向度是通过在由台阶部分2形成的绝缘衬底1上形成第一非晶硅3膜而形成的,该绝缘衬底1将被热处理。接下来,对整个表面进行构图,留下包含台阶部分2上方部分的区域。接下来,在该图案上形成第二非晶硅膜8,并使用第一多晶硅膜4作为晶种以固晶,从而可以形成取向度和控制第二多晶硅膜9的晶界的位置。最后,当形成垂直于阶梯部分2侧的沟道区12i时,电流路径可以与外延生长方向一致。

著录项

  • 公开/公告号JP3216861B2

    专利类型

  • 公开/公告日2001-10-09

    原文格式PDF

  • 申请/专利权人 シャープ株式会社;

    申请/专利号JP19950084373

  • 发明设计人 岩崎 康範;

    申请日1995-04-10

  • 分类号H01L29/786;H01L21/20;H01L21/336;H01L27/12;

  • 国家 JP

  • 入库时间 2022-08-22 01:34:51

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