首页> 外国专利> Method of extracting timing characteristic of transistor circuit, storage medium storing timing characteristic library, method of designing LSI, and gate extraction method

Method of extracting timing characteristic of transistor circuit, storage medium storing timing characteristic library, method of designing LSI, and gate extraction method

机译:晶体管电路的时序特性的提取方法,存储时序特性库的存储介质,LSI的设计方法以及栅极提取方法

摘要

The present invention relates to a method of extracting timing characteristics from transistor circuit data of component design assets (such as a CPU core) such as a CPU core, and an extracted timing characteristic is a timing verification, logic synthesis or circuit of a circuit including a module to be extracted It is used for timing constraints in imine driven layout. In particular, when timing verification is performed by a simulation, the timing rule fitting condition of the module is included in the timing characteristic, so that verification without a pseudo error can be verified. The present invention relates to a structure of a timing characteristic library, a storage medium storing the same, and an LSI design method using the same.
机译:本发明涉及一种从诸如CPU核之类的组件设计资产(例如CPU核)的晶体管电路数据中提取定时特性的方法,并且所提取的定时特性是定时验证,逻辑综合或电路的电路,包括要提取的模块用于亚胺驱动布局中的时序约束。特别地,当通过仿真执行时序验证时,模块的时序规则拟合条件包括在时序特性中,从而可以验证没有伪错误的验证。定时特性库的结构,其存储介质以及使用该定时特性库的LSI设计方法技术领域本发明涉及定时特性库的结构,存储该定时特性库的存储介质以及使用该结构的LSI设计方法。

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