METHOD AND DEVICE FOR CALIBRATING PULSE WIDTH TIMING ERROR CORRECTION IN SEMICONDUCTOR INTEGRATED CIRCUIT TEST

摘要

PROBLEM TO BE SOLVED: To provide a method and device for correcting a pulse width timing error while a high-performance integrated circuit device is being tested by an automatic testing device(ATE). ;SOLUTION: Two outputs are supplied to a driver format logic 82, and are supplied to a strobe format logic 84 after a reciprocating transmission delay. The OR logic operation of both of them is calculated by the logic circuits. By using two independent event sequencers A and B, a higher event speed is achieved. More specifically, the higher event speed is achieved by shifting one event sequencer from the other event sequencer by a slight value, namely a value that is smaller than the value of time that one sequencer spends for generating the repetition of a succeeding event. While one sequencer is outputting data, data is loaded into the other sequencer.;COPYRIGHT: (C)2001,JPO