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LOW DIELECTRIC CONSTANT POROUS SILICEOUS FILM, SEMICONDUCTOR DEVICE AND COATING COMPOSITION

机译:低介电常数多孔硅膜,半导体器件和涂层组成

摘要

PROBLEM TO BE SOLVED: To obtain a porous siliceous film having a low dielectric constant, a semiconductor device containing the porous siliceous film and a coating composition giving the porous siliceous film. SOLUTION: The porous siliceous film is obtained by firing a film of a composition containing an aluminum-containing polysilazane and a poly(meth)acrylic ester and has a relative dielectric constant of 2.5. The semiconductor device contains the porous siliceous film as an interlayer dielectric. The coating composition contains the aluminum-containing polysilazane and the poly(meth)acrylic ester in an organic solvent.
机译:解决的问题:为了获得介电常数低的多孔硅质膜,一种半导体装置,其包含所述多孔硅质膜和提供所述多孔硅质膜的涂料组合物。解决方案:多孔质硅质膜是通过焙烧含有铝的聚硅氮烷和聚(甲基)丙烯酸酯的组合物制成的,其相对介电常数<2.5。该半导体器件包含多孔硅质膜作为层间电介质。该涂料组合物在有机溶剂中包含含铝的聚硅氮烷和聚(甲基)丙烯酸酯。

著录项

  • 公开/公告号JP2001026415A

    专利类型

  • 公开/公告日2001-01-30

    原文格式PDF

  • 申请/专利权人 TONENGENERAL SEKIYU KK;

    申请/专利号JP19990199282

  • 发明设计人 AOKI TOMOKO;SHIMIZU YASUO;

    申请日1999-07-13

  • 分类号C01B33/12;H01L21/316;

  • 国家 JP

  • 入库时间 2022-08-22 01:29:06

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