首页> 外国专利> IMPURITY DIFFUSION METHOD IN SEMICONDUCTOR ELEMENT MANUFACTURING PROCESS, IMPURITY DIFFUSING DEVICE FOR USE THEREIN AND SEMICONDUCTOR ELEMENT MANUFACTURED THEREFROM

IMPURITY DIFFUSION METHOD IN SEMICONDUCTOR ELEMENT MANUFACTURING PROCESS, IMPURITY DIFFUSING DEVICE FOR USE THEREIN AND SEMICONDUCTOR ELEMENT MANUFACTURED THEREFROM

机译:半导体元件制造过程中的杂质扩散方法,用于其中的杂质扩散装置以及由其制造的半导体元件

摘要

PROBLEM TO BE SOLVED: To obtain an impurity diffusion processing method in a semiconductor element manufacturing process which forms a uniform impurity diffusion layer and can carry on an impurity diffusion process high in performance and a yield, an impurity diffusing device for use in the same method, and a semiconductor element containing a solar cell, etc., high in a yield. ;SOLUTION: On an outermost side on a substrate surface side of a semiconductor element substrate of a plurality of rows which are stationed on a boat, a flow path plate for holding uniformly a gas flow path is installed. As this flow path plate, the plate manufactured with silicon is used. Incidentally, the boat may be made by combining a sub-boat with a main boat.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:在半导体元件制造工艺中获得一种形成均匀的杂质扩散层并可以进行高性能和高产率的杂质扩散工艺的杂质扩散处理方法,一种用于该方法的杂质扩散装置以及具有高产率的包含太阳能电池等的半导体元件。 ;解决方案:在固定在舟上的多排半导体元件衬底的衬底表面侧的最外侧,安装有用于均匀地保持气体流路的流路板。作为该流路板,使用由硅制造的板。顺便说一句,该船可以通过将副船与主船结合而制成。;版权所有:(C)2001,JPO

著录项

  • 公开/公告号JP2001185502A

    专利类型

  • 公开/公告日2001-07-06

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP19990365299

  • 发明设计人 HAZUMI KOUICHI;

    申请日1999-12-22

  • 分类号H01L21/22;H01L31/04;

  • 国家 JP

  • 入库时间 2022-08-22 01:27:52

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