首页> 外国专利> EVALUATING PHANTOM OF CT APPARATUS AND EVALUATING METHOD USING THIS AND METHOD OF MANUFACTURING EVALUATING PHANTOM

EVALUATING PHANTOM OF CT APPARATUS AND EVALUATING METHOD USING THIS AND METHOD OF MANUFACTURING EVALUATING PHANTOM

机译:CT设备的幻影评估以及使用该幻影幻影评估方法

摘要

PROBLEM TO BE SOLVED: To accurately evaluate spatial resolution of a cross-sectional image obtained by a high resolution type CT apparatus. ;SOLUTION: A copper film 3 and a polyethylene film 4 different in an absorbing factor of a radioactive ray and thinly workable in a thickness are alternately laminated on a side surface of a columnar material 2 to constitute an evaluating phantom 1, a cross-sectional image is photographed by using the CT apparatus on a cross section of the evaluating phantom 1 almost vertical to the axis of the columnar material 2, and a layer of a stripe-shaped film on the cross-sectional image is observed to evaluate spatial resolution of the cross-sectional image. The spatial resolution can be more accurately evaluated by measuring MTF by using a difference in contrast between two kinds of films in the cross- sectional image.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:准确评估由高分辨率CT设备获得的横截面图像的空间分辨率。 ;解决方案:在圆柱状材料2的侧表面上交替层压铜膜3和聚乙烯膜4,该铜膜3和聚乙烯膜4的放射性射线吸收系数不同,并且厚度可薄加工,以构成评估模型1,横截面使用CT设备在几乎垂直于柱状材料2的轴线的评估体模1的横截面上拍摄图像,并在该横截面上观察条纹状薄膜层以评估其空间分辨率。横截面图像。通过使用横截面图像中两种胶片之间的对比度差异来测量MTF,可以更准确地评估空间分辨率。COPYRIGHT:(C)2001,JPO

著录项

  • 公开/公告号JP2001120532A

    专利类型

  • 公开/公告日2001-05-08

    原文格式PDF

  • 申请/专利权人 TOSHIBA FA SYST ENG CORP;

    申请/专利号JP19990301228

  • 发明设计人 UYAMA KIICHIRO;FUJII MASAJI;

    申请日1999-10-22

  • 分类号A61B6/03;G01T1/161;

  • 国家 JP

  • 入库时间 2022-08-22 01:27:50

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