首页> 外国专利> Production of an epitaxial layer on a single crystalline substrate comprises heating a purified substrate in an epitaxy device while introducing organometallic precursors and a nitrogen-containing gas at a specified flow rate

Production of an epitaxial layer on a single crystalline substrate comprises heating a purified substrate in an epitaxy device while introducing organometallic precursors and a nitrogen-containing gas at a specified flow rate

机译:在单晶衬底上的外延层的生产包括在外延器件中加热纯化的衬底,同时以规定的流速引入有机金属前体和含氮气体

摘要

Production of an epitaxial layer of a group III nitride on a single crystalline substrate comprises purifying the substrate; placing in an epitaxy device; and heating to a suitable temperature while introducing organometallic precursors containing one or more group III elements and a nitrogen-containing gas at a specified flow rate. An Independent claim is also included for a device for producing multiple layers comprising a rotating reaction support (20) having a hollow shaft (29), a rotating shaft (290), a graphite support, a cover (24) and rotating troughs (28). Preferred Features: The single crystalline substrate is made from wafers of Al2O3, Si, Ge, GaAs, GaP or SiC. The nitrogen-containing gas is NH3.
机译:在单晶衬底上制备III族氮化物的外延层包括纯化衬底;以及在衬底上形成衬底。置于外延装置中;加热至合适的温度,同时以规定的流速引入含有一种或多种III族元素和含氮气体的有机金属前体。还包括用于生产多层的设备的独立权利要求,该设备包括具有空心轴(29)的旋转反应支撑件(20),旋转轴(290),石墨支撑件,盖(24)和旋转槽(28) )。优选特征:单晶衬底由Al2O3,Si,Ge,GaAs,GaP或SiC晶片制成。含氮气体是NH 3。

著录项

  • 公开/公告号NL1014734C2

    专利类型

  • 公开/公告日2001-09-25

    原文格式PDF

  • 申请/专利权人 HUGA OPTOTECH INC.;

    申请/专利号NL20001014734

  • 发明设计人 JHY-RONG GONG;

    申请日2000-03-23

  • 分类号H01L33/00;C30B25/14;

  • 国家 NL

  • 入库时间 2022-08-22 01:24:42

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