INTEGRATED CIRCUIT COMPRISING A SELF-TEST DEVICE FOR EXECUTING A SELF-TEST OF THE INTEGRATED CIRCUIT

摘要

The present invention relates to an integrated circuit comprising a self test device for performing a self test of an integrated circuit having a control output (CTR). The integrated circuit also has a program memory (MI) coupled to the self-test device for storing at least one test program (P) provided from outside of the integrated circuit, the test program being self-tested during self-test. Executed by the device. At this time, the self-test device B controls, via the control output CTR, that each test program to be executed is loaded into the program memory from outside the integrated circuit.