首页> 外国专利> - - COPPER CHEMICAL-MECHANICAL POLISHING PROCESS USING A FIXED ABRASIVE POLISHING PAD AND A COPPER LAYER CHEMICAL-MECHANICAL POLISHING SOLUTION SPECIFICALLY ADAPTED FOR CHEMICAL-MECHANICAL POLISHING WITH A FIXED ABRASIVE PAD

- - COPPER CHEMICAL-MECHANICAL POLISHING PROCESS USING A FIXED ABRASIVE POLISHING PAD AND A COPPER LAYER CHEMICAL-MECHANICAL POLISHING SOLUTION SPECIFICALLY ADAPTED FOR CHEMICAL-MECHANICAL POLISHING WITH A FIXED ABRASIVE PAD

机译:--使用固定的磨料抛光垫和专门为固定的磨料垫进行化学机械抛光而采用的铜层化学机械抛光溶液进行的铜化学机械抛光工艺

摘要

The present invention relates to a copper chemical-mechanical polishing process using a fixed polishing pad and a copper-layer chemical-mechanical polishing solution specifically used for chemical-mechanical polishing using a fixed polishing pad. In one embodiment, the process is described at a pH of 7.0 or higher. In one embodiment, the process is described at a pH of 7.0 or less. In one embodiment, a copper layer chemo-mechanical polishing solution specifically used for a chemical-mechanical polishing solution using a fixed polishing pad comprises a copper oxidation component present at 1% to 15% by volume, 0.01% to 2% Chemical-mechanical corrosion inhibiting substances present at a pH of 7.0 or lower. In one embodiment, a copper layer chemical-mechanical polishing solution specifically used for a chemical-mechanical polishing solution using a fixed polishing pad comprises copper oxidation components present at 1% to 15% by volume, 0.1% to 15% The present copper complex is composed of a pH of 7.0 or less.
机译:本发明涉及一种使用固定抛光垫的铜化学机械抛光工艺以及一种专门用于使用固定抛光垫的化学机械抛光的铜层化学机械抛光液。在一个实施方案中,描述了该方法在7.0或更高的pH下。在一个实施方案中,描述了该方法在7.0或更低的pH下。在一个实施例中,一种专门用于使用固定抛光垫的化学机械抛光液的铜层化学机械抛光液包含以体积计1%至15%,化学机械腐蚀0.01%至2%存在的铜氧化组分。 pH为7.0或更低的抑制性物质。在一个实施方案中,专门用于使用固定抛光垫的化学机械抛光溶液的铜层化学机械抛光溶液包含以体积计1%至15%,以体积计0.1%至15%存在的铜氧化组分。由7.0以下的pH值组成。

著录项

  • 公开/公告号KR20010080972A

    专利类型

  • 公开/公告日2001-08-25

    原文格式PDF

  • 申请/专利权人 추후제출;

    申请/专利号KR20017005873

  • 发明设计人 코프라딘에쉬;

    申请日2001-05-10

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-22 01:13:00

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