首页> 外国专利> A METHOD OF FABRICATING THIN FILM TRANSISTOR USING SELECTIVE SILICON ION-IMPLANTATION AND NOVEL EXIMER LASER CRYSTALLIZATION OF AMORPHOUS SILICON FILM

A METHOD OF FABRICATING THIN FILM TRANSISTOR USING SELECTIVE SILICON ION-IMPLANTATION AND NOVEL EXIMER LASER CRYSTALLIZATION OF AMORPHOUS SILICON FILM

机译:利用选择性硅离子注入和非晶硅薄膜的新型电子激光结晶制备薄膜晶体管的方法

摘要

The present invention to get, and more particularly relates to a thin film transistor manufacturing method using the polycrystalline silicon thin film formed and him using laser crystallization, it is possible to use a low temperature process, the polycrystalline silicon thin film with a uniform and reproducible on semiconductor technology for that purpose . The present invention increase the crystal grain of the polycrystalline silicon by using a part of inducing mechanical strain in the thin film by carrying out selective to high-energy, high-density silicon ion implantation in the amorphous silicon thin film before laser crystallization, and deformed in the nucleation of the laser crystallization process and at the same time by reducing the trap density can be uniform and produce a polycrystalline silicon thin film of good quality with reproducible.
机译:本发明尤其涉及一种使用形成的多晶硅薄膜的薄膜晶体管的制造方法,以及利用激光结晶的薄膜晶体管的制造方法,可以使用低温工艺,使多晶硅薄膜具有均匀且可复制的特性。为此目的研究半导体技术。本发明通过在激光晶化之前对非晶硅薄膜进行选择性的高能,高密度的硅离子注入,并利用其在薄膜中引起机械应变的一部分来增加多晶硅的晶粒,并使其变形。在成核的激光结晶过程中,同时通过降低陷阱密度可以使其均匀并生产出具有可再现性的高质量的多晶硅薄膜。

著录项

  • 公开/公告号KR100296141B1

    专利类型

  • 公开/公告日2001-07-12

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990044236

  • 发明设计人 윤찬의;한오형;

    申请日1999-10-13

  • 分类号H01L21/265;

  • 国家 KR

  • 入库时间 2022-08-22 01:12:11

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