首页> 外国专利> Metal oxide transistor in a silicon-on-insulator construction suppressing effect of suspended body includes barrier layer formed by doping- and semiconductor layers, without application of external voltage

Metal oxide transistor in a silicon-on-insulator construction suppressing effect of suspended body includes barrier layer formed by doping- and semiconductor layers, without application of external voltage

机译:绝缘体上硅的构造中的金属氧化物晶体管对悬浮体的抑制作用包括由掺杂层和半导体层形成的势垒层,而无需施加外部电压

摘要

First and second doping layers (51, 52) of a second conductor type, spaced from the first, are located in an upper surface of the semiconductor layer (4) and do not contact the insulating layer (2). An electrode (7) is located on part of the upper surface of an insulating film (6) between first and second doping layers. A barrier layer (90) formed by the first doping layer (51) and the semiconductor layer (4), extends up to the insulation layer (2) without application of an external voltage.
机译:与第一导体层隔开的第二导体类型的第一和第二掺杂层(51、52)位于半导体层(4)的上表面中,并且不接触绝缘层(2)。电极(7)位于第一和第二掺杂层之间的绝缘膜(6)的上表面的一部分上。由第一掺杂层(51)和半导体层(4)形成的阻挡层(90)在不施加外部电压的情况下一直延伸到绝缘层(2)。

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