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Methods for forming conductive micro-bumps and recessed contacts for flip-chip technology and method of flip-chip assembly

机译:用于倒装芯片技术的形成导电微凸块和凹陷触点的方法以及倒装芯片组装的方法

摘要

A flip-chip semiconductor die assembly is provided with discrete projecting connective elements on the die and mating recessed contacts on the substrate, together forming a plurality of electrical, mechanical, and thermal connections between the die and substrate. The element and recess provide a self-aligning feature. Compared to the prior art, a less costly, simpler method for forming the element and recess is provided, which method requires fewer process steps, uses less raw materials, and generates less waste. The method allows for placement of fine-pitch connective elements and precise control of element size and height.
机译:倒装芯片半导体管芯组件在管芯上具有离散的突出连接元件,并且在基板上具有配合的凹入触点,一起在管芯与基板之间形成多个电,机械和热连接。元件和凹槽提供自对准功能。与现有技术相比,提供了一种成本更低,更简单的形成元件和凹槽的方法,该方法需要较少的工艺步骤,使用较少的原材料并且产生较少的浪费。该方法允许放置细间距的连接元素,并可以精确控制元素的大小和高度。

著录项

  • 公开/公告号US6245594B1

    专利类型

  • 公开/公告日2001-06-12

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US19970906297

  • 发明设计人 ZHIQIANG WU;TONGBI JIANG;SALMAN AKRAM;

    申请日1997-08-05

  • 分类号H01L214/40;

  • 国家 US

  • 入库时间 2022-08-22 01:04:08

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