首页> 外国专利> LOCOS mask for suppression of narrow space field oxide thinning and oxide punch through effect

LOCOS mask for suppression of narrow space field oxide thinning and oxide punch through effect

机译:LOCOS掩膜,用于抑制狭窄空间场的氧化物变薄和氧化穿孔效应

摘要

A novel design of an oxidation mask for improved control of birds beak and more specifically for tailoring and smoothing the field oxide isolation profile in the vicinity of the birds beak. The mask design is particularly advantageous for narrow field isolation spacings found in sub half-micron integrated circuit technology. The mask uses a thin tapered silicon nitride foot along its lower edge to allow nominal expansion of the oxide during the early stages of oxidation, thereby permitting in-situ stress relief as well as a smoothing of the oxide profile. The taper of the foot provides a gradual increase in mask stiffness as oxidation proceeds under the mask edge, allowing greatest flexibility during the early rapid growth period followed by increasing stiffness during the later stages when the growth rate has slowed, thereby inhibiting the penetration of birds beak. Shear stresses responsible for dislocation generation are reduced by as much as fifty fold. This stress reduction is accompanied by an improvement in surface topography as well as suppression of oxide punch though and the narrow oxide thinning effect.
机译:氧化掩膜的新颖设计,可以改善鸟喙的控制,尤其是用于调整和平滑鸟喙附近的场氧化隔离曲线。掩模设计对于亚半微米集成电路技术中发现的窄场隔离间距特别有利。掩模沿其下边缘使用细的锥形氮化硅脚,以在氧化的早期阶段允许氧化物的名义膨胀,从而实现原位应力消除以及氧化物轮廓的平滑化。脚的锥度随着面罩边缘下的氧化而逐渐增加面罩的刚度,从而在早期快速生长阶段提供最大的柔韧性,然后在后期生长速度减慢的阶段增加刚度,从而抑制了鸟类的穿透喙。导致位错产生的剪切应力降低了多达50倍。这种应力的减少伴随着表面形貌的改善以及氧化物穿孔的抑制和狭窄的氧化物稀化效果。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号