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PLASMA-ENHANCED FILM FORMING METHOD AND PLASMA- ENHANCED CVD APPARATUS

机译:等离子体增强膜形成方法和等离子体增强CVD装置

摘要

PROBLEM TO BE SOLVED: To provide a plasma-enhanced film forming method and a plasma- enhanced CVD apparatus which forms an oxide film, without causing reduction deterioration of device elements.;SOLUTION: The method comprises applying a high frequency power of 500 W or more per total mass flow rate of 100 SCCM of a material gas and an oxidative gas, setting a mass flow rate ratio of the oxidative gas to a material gas to 3 or more to 1 and setting the film forming temperature to a range of 100-300°C, thus forming an oxide film. For forming the oxide film, a protective (oxide) film of 500 Å or more is formed, without applying a bias, then an embedded film formation is conducted with an applied bias, and finally a high-speed film forming is conducted without bias. Oxidative gas feed nozzles are disposed above material gas feed nozzles and are located alternately in the circumferential direction of a film-forming chamber in a plan view.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种等离子体氧化膜形成方法和一种形成氧化膜的等离子体增强CVD设备,而不会导致器件元件的还原性能下降。解决方案:该方法包括施加500 W或200 W的高频功率原料气体和氧化气体的总质量流量为100 SCCM时,将氧化气体与原料气体的质量流量比设定为3以上或1,并将成膜温度设定为100- 300℃,从而形成氧化膜。为了形成氧化膜,使用500ang的保护(氧化)膜。在不施加偏压的情况下形成大于或等于1的膜,然后在施加偏压的情况下进行嵌入膜的形成,最后在没有偏压的情况下进行高速成膜。氧化气体进料喷嘴布置在材料气体进料喷嘴上方,并且在平面图中沿成膜腔室的圆周方向交替放置。;版权所有:(C)2002,JPO

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