首页> 外国专利> THIN FILM TRANSISTOR USING INTEGRATED THIN FILM OF MOW/AL OR AL ALLOY/MOW, THIN FILM TRANSISTOR ARRAY AND MANUFACTURING METHOD THEREFOR

THIN FILM TRANSISTOR USING INTEGRATED THIN FILM OF MOW/AL OR AL ALLOY/MOW, THIN FILM TRANSISTOR ARRAY AND MANUFACTURING METHOD THEREFOR

机译:利用MOW / AL或AL合金/ MOW的集成薄膜,薄膜晶体管阵列及其制造方法的薄膜晶体管

摘要

PROBLEM TO BE SOLVED: To overcome the problem of damage to a base film by dry etching when a Ti/Al/Ti film is used as the source/drain wiring electrode of an amorphous silicon thin film transistor.;SOLUTION: When MoW/Al/MoW is used as the source/drain wiring electrode, wet etching is realized. The cross section shape of the wiring electrode is controlled by optimizing various conditions. In working the electrode, damage to an underlying semiconductor layer is eliminated and characteristic deterioration is prevented.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:当使用Ti / Al / Ti膜作为非晶硅薄膜晶体管的源极/漏极布线电极时,要克服干法蚀刻对基膜造成的损坏的问题;解决方案:当MoW / Al / MoW用作源极/漏极布线电极,实现了湿蚀刻。通过优化各种条件来控制配线电极的截面形状。在工作电极时,消除了对下面的半导体层的损坏并防止了性能下降。;版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP2002299630A

    专利类型

  • 公开/公告日2002-10-11

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20010098663

  • 发明设计人 INOUE MAYUMI;

    申请日2001-03-30

  • 分类号H01L29/786;G02F1/1368;G09F9/30;H01L21/28;H01L21/306;H01L21/3205;H01L21/3213;H01L21/336;H05B33/14;H05B33/26;

  • 国家 JP

  • 入库时间 2022-08-22 00:59:43

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