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- Method Of Forming MoW Thin Film Pattern And Method Of Manufacturing Thin Film Transistor Of Liquid Crystal Display Device Using The Same

机译:-MoW薄膜图案的形成方法和使用该方法制造液晶显示装置的薄膜晶体管的方法

摘要

PURPOSE: A method for forming a molybdenum-tungsten thin film pattern and a method for manufacturing a TFT(Thin Film Transistor) substrate of an LCD(Liquid Crystal Display) using the same are provided to be capable of supplying optimum condition capable of forming an easily etched molybdenum-tungsten thin film. CONSTITUTION: A sputtering process is carried out for forming a molybdenum-tungsten thin film from the room temperature to 80 C. At this time, the sputtering process is carried out with a speed of 0.010-0.015 angstrom/Ws. Then, an etching process is carried out at the molybdenum-tungsten thin film for selectively patterning the molybdenum-tungsten thin film. Preferably, the target size of the sputtering process is in the range of 144 10 x 660 10(mm x mm).
机译:目的:提供一种形成钼-钨薄膜图案的方法和一种使用该方法制造LCD(液晶显示器)的TFT(薄膜晶体管)基板的方法,以能够提供能够形成液晶显示器的最佳条件。易蚀刻的钼钨薄膜。组成:进行溅射工艺以形成从室温到80°C的钼钨薄膜。这时,溅射工艺以0.010-0.015埃/ Ws的速度进行。然后,在钼钨薄膜上进行蚀刻工艺以选择性地图案化钼钨薄膜。溅射工艺的目标尺寸最好在144×10×660×10(mm×mm)的范围内。

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