TESTING METHOD FOR ELECTRONIC COMPONENT WITH DRIFT OF AVERAGE VALUE TAKEN INTO CONSIRATION

摘要

PROBLEM TO BE SOLVED: To more quickly detect the tendency of drift in manufacturing a component.;SOLUTION: A test method for an electronic component for realizing the optimization of a testing period is composed of selecting earliest measurement day (Dm) by a first test day (D0). In this method, statistical images (IS) obtained with the population groups (P1, P2) are considered and these statistical images (IS) are compared by using a criterion with each other, and thus the earliest measurement day is selected. In this criterion, while the same test of the different measurement day is repeated, the average value and the width of the response output with the test population are considered.;COPYRIGHT: (C)2002,JPO