首页> 外国专利> PROBE FOR DETECTING OR PROJECTING EVANESCENT LIGHT, ITS MANUFACTURING METHOD, SURFACE OBSERVATION DEVICE CONSTITUTED OF IT, EXPOSURE DEVICE, OPTICAL ELEMENT COMPOSED OF THE SYSTEM, AND INFORMATION PROCESSOR

PROBE FOR DETECTING OR PROJECTING EVANESCENT LIGHT, ITS MANUFACTURING METHOD, SURFACE OBSERVATION DEVICE CONSTITUTED OF IT, EXPOSURE DEVICE, OPTICAL ELEMENT COMPOSED OF THE SYSTEM, AND INFORMATION PROCESSOR

机译:探测或投射隐身光的探头,其制造方法,由其组成的表面观察装置,曝光装置,由系统组成的光学元件以及信息处理器

摘要

PROBLEM TO BE SOLVED: To provide a probe that can be improved in evanescent light generat ing efficiency, in strength, and also in yield and productivity even when a lens is provided in the probe and detects or projects evanescent light, and to provide a method of manufacturing the probe, a surface observation device constituted of the probe, an exposure device, an optical element composed of the system, and an information processor.;SOLUTION: The probe which detects or projects evanescent light is constituted of a member having a plumb-like through hole and an aspheric lens provided in the through hole. The probe is manufactured by the method.;COPYRIGHT: (C)2002,JPO
机译:要解决的问题:提供一种即使在探针中装有透镜并检测或投射渐逝光时也能改善e逝光的产生效率,强度以及产率和生产率的探针,并提供一种方法探针的制造,由探针构成的表面观察装置,曝光装置,由该系统组成的光学元件和信息处理器;解决方案:检测或投射e逝光的探针由具有铅垂的部件构成类通孔和在该通孔中提供的非球面透镜。该探针是通过该方法制造的。;版权所有:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002286616A

    专利类型

  • 公开/公告日2002-10-03

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20010083874

  • 发明设计人 YAMADA TOMOHIRO;SHIMADA YASUHIRO;

    申请日2001-03-22

  • 分类号G01N13/14;G11B7/135;G11B7/22;G11B7/26;G12B21/06;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-22 00:56:29

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号