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X-RAY MEASURING METHOD AND POLAR DIAGRAM MEASURING METHOD

机译:X射线测量方法和极坐标图测量方法

摘要

PROBLEM TO BE SOLVED: To highly reliably perform measurement by resolving incorrectness in measurement based on fading phenomena which a stimulable fluorescent materials possess in the case of performing measurement through the use of the stimulable fluorescent material in a polar diagram measuring method and other X-ray measuring methods. SOLUTION: Different locations of the stimulable fluorescent material 2 is irradiated with X-rays R1 emergent from a sample S according to a predetermined timing pattern to accumulate data at each location. The data is corrected on the basis of the change characteristics with the passage of time of the energy holding characteristics of the stimulable fluorescent material 2, and the intensity distribution of X-rays is obtained on the basis of the data after the correction.
机译:解决的问题:通过解决在极坐标图测量方法和其他X射线中通过使用可激发荧光材料进行测量的情况下基于可激发荧光材料所具有的褪色现象的测量中的不正确性,来高度可靠地执行测量测量方法。解决方案:根据预定的定时模式,从样本S发出的X射线R1照射可激发荧光材料2的不同位置,以在每个位置累积数据。基于随时间变化的可激发荧光材料2的能量保持特性来校正数据,并且基于校正后的数据获得X射线的强度分布。

著录项

  • 公开/公告号JP2002318210A

    专利类型

  • 公开/公告日2002-10-31

    原文格式PDF

  • 申请/专利权人 RIGAKU CORP;

    申请/专利号JP20010122073

  • 发明设计人 DOSHIYOU AKIHIDE;

    申请日2001-04-20

  • 分类号G01N23/207;G01T1/00;G01T1/29;G03B42/02;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:59

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