首页> 外国专利> X-RAY POSITION MEASURING APPARATUS, A POSITION MEASURING METHOD OF X-RAY POSITION MEASURING APPARATUS AND A POSITION MEASURING PROGRAM OF X-RAY POSITION MEASURING APPARATUS

X-RAY POSITION MEASURING APPARATUS, A POSITION MEASURING METHOD OF X-RAY POSITION MEASURING APPARATUS AND A POSITION MEASURING PROGRAM OF X-RAY POSITION MEASURING APPARATUS

机译:X射线位置测量装置,X射线位置测量装置的位置测量方法以及X射线位置测量装置的位置测量程序

摘要

PURPOSE: X-ray position measuring apparatus, a position measuring method of x-ray position measuring apparatus and a position measuring program of x-ray position measuring apparatus are provided to change magnification rate by zoom in and out the X ray image penetrated through object.;CONSTITUTION: X-RAY POSITION MEASURING APPARATUS(10) are provided to X-ray ejector(10a), X-ray camera(10b), a work mounting table(10c), and 1 first movable part, a second movable part, an image display, a jig for correction position, a controller, a memory unit. The controller comprises a first moving means, a first measuring memory means, a second moving means, and a first location measuring means. The first measuring memory means saves the error value of location in the memory unit.;COPYRIGHT KIPO 2012
机译:目的:提供X射线位置测量设备,X射线位置测量设备的位置测量方法和X射线位置测量设备的位置测量程序,以通过放大和缩小穿过被摄体的X射线图像来改变放大率。组成:X射线位置测量装置(10)提供给X射线喷射器(10a),X射线照相机(10b),工作台(10c)和一个第一可移动部分,第二可移动部分,图像显示器,用于校正位置的夹具,控制器,存储单元。控制器包括第一移动装置,第一测量存储装置,第二移动装置和第一位置测量装置。第一个测量存储装置将位置的误差值保存在存储单元中。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120040659A

    专利类型

  • 公开/公告日2012-04-27

    原文格式PDF

  • 申请/专利权人 SEIKO PRECISION INC.;

    申请/专利号KR20110103617

  • 发明设计人 KASHIMURA TSUNEO;ASUKA TAKU;

    申请日2011-10-11

  • 分类号G01B15;H05K3;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:13

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