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METHOD FOR PRODUCING GaN-BASED SEMICONDUCTOR CRYSTAL AND GaN-BASED SEMICONDUCTOR BASIC MATERIAL

机译:氮化镓基半导体晶体和氮化镓基半导体基本材料的制备方法

摘要

PROBLEM TO BE SOLVED: To provide a method for producing a high quality GaN-based crystal, and a GaN-based semiconductor basic material in which a high quality GaN- based crystal can be grown by that method.;SOLUTION: Protrusions and recesses (or a level difference) 1a are formed on the surface of a crystal substrate 1 composed of a material different from a GaN-based semiconductor and a GaN-based crystal 2 is grown directly on the surface where protrusions and recesses are formed with no intermediary of a low temperature GaN-based buffer layer thus obtaining a GaN-based crystal layer 3. Lateral growth of the GaN-based crystal is suppressed by the protrusions and recesses (or a level difference) on the surface of the crystal substrate and the surface is planarized with no intermediary of the buffer layer.;COPYRIGHT: (C)2002,JPO
机译:要解决的问题:提供一种生产高质量GaN基晶体的方法,以及一种可以通过该方法生长出高质量GaN基晶体的GaN基半导体基础材料。在由与GaN基半导体不同的材料构成的晶体基板1的表面上形成1a或GaN晶体2,并且在不形成任何凹凸的表面上直接生长GaN基晶体2。低温的GaN基缓冲层,从而获得GaN基晶体层3。GaN基晶体的横向生长受到晶体基板表面和表面上的凹凸的抑制(或水平差)。平面化,没有缓冲层的中间层。;版权所有:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002289540A

    专利类型

  • 公开/公告日2002-10-04

    原文格式PDF

  • 申请/专利权人 MITSUBISHI CABLE IND LTD;

    申请/专利号JP20010091129

  • 发明设计人 OKAGAWA HIROAKI;TADATOMO KAZUYUKI;

    申请日2001-03-27

  • 分类号H01L21/205;H01L33/00;H01S5/323;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:49

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