首页> 外国专利> SINGLE CRYSTAL SiC AND METHOD OF PRODUCING THE SAME AND SiC SEMI CONDUCTOR DEVICE AND SiC COMPOSITE MATERIAL

SINGLE CRYSTAL SiC AND METHOD OF PRODUCING THE SAME AND SiC SEMI CONDUCTOR DEVICE AND SiC COMPOSITE MATERIAL

机译:单晶SiC及其制造方法,SiC半导体器件和SiC复合材料

摘要

PROBLEM TO BE SOLVED: To obtain a single crystal SiC which has a low plane defect density of SiC and is capable of being produced with good productivity, and a method of producing the same, and to obtain a Sic semiconductor device and a SiC composite material.;SOLUTION: The method of producing the single crystal SiC has a process of forming a single crystal SiC layer wherein a thin single crystal SiC layer 101a is formed on the surface of a substrate 101 by heating the substrate 101 in the presence of a raw material M containing C and, if necessary, C and Si, and a process of accumulating Sic wherein SiC 101b is accumulated on the single crystal SiC layer 101a formed in the former process, by a gas phase method or a liquid phase method. In the process of forming the single crystal Sic layer, the raw material is fed in the vicinity of the surface of the substrate and a partial pressure of the raw material therein is made higher than a prescribed pressure with respect to that of each impurity-substance, thus the impurity-substance is suppressed to reach the surface of the substrate, so that the process of forming the single crystal SiC is carried out while preventing the surface of the substrate from being etched with the impurity-substance.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:获得具有低的SiC的平面缺陷密度并且能够以良好的生产率制造的单晶SiC及其制造方法,并且获得Sic半导体器件和SiC复合材料。解决方案:生产单晶SiC的方法具有形成单晶SiC层的过程,其中通过在存在未加工的原料的情况下加热基板101在基板101的表面上形成薄的单晶SiC层101a。包含C以及必要时包含C和Si的材料M,以及通过气相法或液相法在其中Sic的沉积过程中,其中SiC 101b沉积在由前一过程形成的单晶SiC层101a上。在形成单晶Sic层的过程中,将原料进料到基板表面附近,并使其中的原料分压相对于每种杂质物质的分压高于规定压力。 ,因此,杂质被抑制到达衬底的表面,从而在防止衬底表面被杂质腐蚀的同时,进行形成单晶SiC的工艺。日本特许厅

著录项

  • 公开/公告号JP2002220299A

    专利类型

  • 公开/公告日2002-08-09

    原文格式PDF

  • 申请/专利权人 HOYA CORP;

    申请/专利号JP20010011312

  • 发明设计人 NAGASAWA HIROYUKI;YAGI KUNIAKI;

    申请日2001-01-19

  • 分类号C30B29/36;H01L21/205;H01L29/872;H01L33/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:54:44

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号